Journal of Geo-information Science >
Lithological Mapping by Multiple Reference Spectra Based SAM
Received date: 2015-03-16
Request revised date: 2015-04-30
Online published: 2016-01-10
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The spectral angle mapper (SAM) is a spectral matching method. This method can determine the types of target objects through quantifying the spectral similarity between a target pixel spectrum and a known reference spectrum.SAM has been widely used in rock type identification that uses multispectral data. In the most existing studies, a mean reflectance spectrum of a specific lithological training area has been used as the reference spectrum for the lithological class in SAM. However, the SAM, which uses the mean spectrum, does not take into account the spectral variability, which is an inherent property of many rocks. Andthe spectral variabilityseriously affects SAM classification results.In order to eliminate the impactof the spectral variability inside the lithological classes, a SAM method based on multiple reference spectra is used in this research. First, a geological map of the study area was used to select training areas forfive lithological classes from the Landsat-8 data of the study area.Then the spectral variability inside the lithological classes and the separability between the lithological classeswereexamined. At last, both ofthe SAM with mean reference spectrum and the multiple reference spectra based SAM wereused in lithological mapping of Landsat-8 data in the study area.The results show that the multiple reference spectra based SAM successfully eliminated the influence of the spectral variability on the SAM with mean reference spectrum, and madesignificant improvement tothe accuracy of lithological mapping.
SHUAI Shuang , ZHANG Zhi , WANG Shaojun , CHEN An . Lithological Mapping by Multiple Reference Spectra Based SAM[J]. Journal of Geo-information Science, 2016 , 18(1) : 133 -140 . DOI: 10.3724/SP.J.1047.2016.00133
Fig. 1 The choice of lithological training areas图1 岩石单元训练区的选择 |
Fig. 2 The mean spectral curves and pixels’ spectral curves of different lithological training areas图2 各岩石单元训练区像元光谱曲线和均值光谱曲线 |
Tab. 1 The mean angle and standard deviation between pixels of different lithological training areas表1 各岩石单元训练区内像元间光谱角均值、标准差表 |
K1 | K2 | K3 | E1 | E2 | |
---|---|---|---|---|---|
均值 | 2.5742 | 3.2127 | 2.7956 | 3.4711 | 2.7143 |
标准差 | 1.4546 | 1.6973 | 1.2803 | 1.8437 | 1.4631 |
Tab. 2 The J-M values of different lithological training areas表2 各岩石单元间J-M距离 |
J-M距离 | K1 | K2 | K3 | E1 | E2 |
---|---|---|---|---|---|
K1 | 1.989 | 1.998 | 1.993 | 2.000 | |
K2 | 1.989 | 1.869 | 1.960 | 1.995 | |
K3 | 1.998 | 1.869 | 1.989 | 1.981 | |
E1 | 1.993 | 1.960 | 1.989 | 2.000 | |
E2 | 2.000 | 1.995 | 1.981 | 2.000 |
Tab. 3 The optimization of different lithological training areas表3 各岩石单元训练区像元优化情况 |
训练区 | K1 | K2 | K3 | E1 | E2 |
---|---|---|---|---|---|
原始像元数 | 64 | 30 | 64 | 36 | 63 |
剩余像元数 | 60 | 28 | 55 | 27 | 55 |
像元剔除率(%) | 6.25 | 6.67 | 14.06 | 25.00 | 12.70 |
Tab. 4 Confusion matrices of the classification results of two SAM methods表4 2种SAM岩性划分结果精度评价 |
类别 | 均值参照光谱库的SAM | 多元参照光谱库的SAM | |||
---|---|---|---|---|---|
生产者精度(%) | 用户精度(%) | 生产者精度(%) | 用户精度(%) | ||
K1 | 68.21 | 95.98 | 93.39 | 96.93 | |
K2 | 58.80 | 92.98 | 80.03 | 63.44 | |
K3 | 89.07 | 64.48 | 89.43 | 80.44 | |
E1 | 45.21 | 34.78 | 72.10 | 93.66 | |
E2 | 91.40 | 90.96 | 85.11 | 98.06 | |
总体精度 | 76.8057 | 86.4557 | |||
Kappa系数 | 0.6989 | 0.8250 |
Fig. 3 The classifications effects of two SAM methods图3 2种SAM方法的分类效果图 |
The authors have declared that no competing interests exist.
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